Local Mapping of Generation and Recombination Lifetime in BiFeO₃ Single Crystals by Scanning Probe Photoinduced Transient SpectroscopyALEXE, Marin.Nano letters (Print). 2012, Vol 12, Num 5, pp 2193-2198, issn 1530-6984, 6 p.Article

Higher-order electromechanical response of thin films by contact resonance piezoresponse force microscopy : Nanoscale ferroelectricsHARNAGEA, Catalin; PIGNOLET, Alain; ALEXE, Marin et al.IEEE transactions on ultrasonics, ferroelectrics, and frequency control. 2006, Vol 53, Num 12, pp 2309-2322, issn 0885-3010, 14 p.Article

Nucleation-Induced Self-Assembly of Multiferroic BiFeO₃―CoFe₂O₄ NanocompositesSTRATULAT, Sergiu M; XIAOLI LU; MORELLI, Alessio et al.Nano letters (Print). 2013, Vol 13, Num 8, pp 3884-3889, issn 1530-6984, 6 p.Article

High-resolution electron energy-loss spectroscopy of BaTiO₃/SrTiO₃ multilayersZHANG, Jingmin; VISINOIU, Alina; HEYROTH, Frank et al.Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 6, pp 064108.1-064108.7, issn 1098-0121Article

Texture optimization process of ZnO:Al thin films using NH₄Cl aqueous solution for applications as antireflective coating in thin film solar cellsFERNANDEZ, S; GANDIA, J. J.Thin solid films. 2012, Vol 520, Num 14, pp 4698-4702, issn 0040-6090, 5 p.Conference Paper

Metal-induced negative oxide charge detected by an alternating current surface photovoltage in thermally oxidized Fe-contaminated n-type Si (001) wafersSHIMIZU, Hirofumi; OTSUKI, Tomohiro.Thin solid films. 2012, Vol 520, Num 14, pp 4808-4811, issn 0040-6090, 4 p.Conference Paper

Proceedings of the EMRS 2009 Spring Meeting Symposium H: Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films IICRACIUN, Valentin; GUILLOUX-VIRY, Maryline; ALEXE, Marin et al.Thin solid films. 2010, Vol 518, Num 16, issn 0040-6090, 277 p.Conference Proceedings

A novel approach for fabrication of bismuth-silicon dioxide core-shell structures by atomic layer depositionLEE, Jongmin; FARHANGFAR, Shadyar; RENBIN YANG et al.Journal of material chemistry. 2009, Vol 19, Num 38, pp 7050-7054, issn 0959-9428, 5 p.Article

Proceedings of the EMRS 2011 Spring Meeting Symposium D: Processing and Characterization of Nanoscale Multi Functional Oxide Films IIICRACIUN, Valentin; GUILLOUX-VIRY, Maryline; ALEXE, Marin et al.Thin solid films. 2012, Vol 520, Num 14, issn 0040-6090, 323 p.Conference Proceedings

Ultrahigh Density Array of Epitaxial Ferroelectric Nanoislands on Conducting SubstratesKIM, Youngsuk; HAN, Hee; KIM, Yunseok et al.Nano letters (Print). 2010, Vol 10, Num 6, pp 2141-2146, issn 1530-6984, 6 p.Article

Characterization of sol-gel derived TiO₂/ZrO₂ films and powders by Raman spectroscopyNAUMENKO, A; GNATIUK, Iu; SMIRNOVA, N et al.Thin solid films. 2012, Vol 520, Num 14, pp 4541-4546, issn 0040-6090, 6 p.Conference Paper

Correlation between strain and the metal-insulator transition in epitaxial V₂O₃ thin films grown by Molecular Beam EpitaxyDILLEMANS, L; LIETEN, R. R; MENGHINI, M et al.Thin solid films. 2012, Vol 520, Num 14, pp 4730-4733, issn 0040-6090, 4 p.Conference Paper

Defect generation during silicon oxidation: A Kinetic Monte Carlo studyALI-MESSAOUD, A; CHIKOUCHE, A; ESTEVE, A et al.Thin solid films. 2012, Vol 520, Num 14, pp 4734-4740, issn 0040-6090, 7 p.Conference Paper

Electronic structure and formation mechanism of complex Ti-Nb oxideKHOVIV, D. A; ZAYTSEV, S. V; IEVLEV, V. M et al.Thin solid films. 2012, Vol 520, Num 14, pp 4797-4799, issn 0040-6090, 3 p.Conference Paper

Fabrication and characterization of nanoporous ZnO layers for sensing applicationsWAGNER, Alexander; BAKIN, Andrey; OTTO, Torsten et al.Thin solid films. 2012, Vol 520, Num 14, pp 4662-4665, issn 0040-6090, 4 p.Conference Paper

High quality epitaxial ZnO films grown on solid-phase crystallized buffer layersKUWAHARA, Kazunari; ITAGAKI, Naho; NAKAHARA, Kenta et al.Thin solid films. 2012, Vol 520, Num 14, pp 4674-4677, issn 0040-6090, 4 p.Conference Paper

Introduction of zirconium oxide in a hardmask concept for highly selective patterning of scaled high aspect ratio trenches in siliconPAUL, Jan; RIEDEL, Stefan; RUDOLPH, Matthias et al.Thin solid films. 2012, Vol 520, Num 14, pp 4527-4531, issn 0040-6090, 5 p.Conference Paper

Molecular beam epitaxy growth of BaTiO₃ thin films and crucial impact of oxygen content conditions on the electrical characteristicsNIU, G; GAUTIER, B; YIN, S et al.Thin solid films. 2012, Vol 520, Num 14, pp 4595-4599, issn 0040-6090, 5 p.Conference Paper

Optical properties and band gap characterization of high dielectric constant oxidesFURSENKO, O; BAUER, J; LUPINA, G et al.Thin solid films. 2012, Vol 520, Num 14, pp 4532-4535, issn 0040-6090, 4 p.Conference Paper

Preparation of nanostructured ZnO nanorods in a hydrothermal-electrochemical processSIMA, Mariana; VASILE, Eugeniu; SIMA, Marian et al.Thin solid films. 2012, Vol 520, Num 14, pp 4632-4636, issn 0040-6090, 5 p.Conference Paper

Pulsed laser deposition of ultrathin BaTiO3/Fe bi-layers: Structural characterization and piezoelectric responseZENKEVICH, A; MINNEKAEV, M; LEBEDINSKII, Yu et al.Thin solid films. 2012, Vol 520, Num 14, pp 4586-4589, issn 0040-6090, 4 p.Conference Paper

Temperature behavior of electrical properties of high-k lead-magnesium-niobium titanate thin-filmsWENBIN CHEN; MCCARTHY, Kevin G; COPUROGLU, Mehmet et al.Thin solid films. 2012, Vol 520, Num 14, pp 4523-4526, issn 0040-6090, 4 p.Conference Paper

X-ray and transmission electron microscopy structural characterization of multifunctional Perovskite thin filmsBOUDARD, M; GIRARDOT, C; IHZAZ, N et al.Thin solid films. 2012, Vol 520, Num 14, pp 4608-4612, issn 0040-6090, 5 p.Conference Paper

Er³⁺,Yb³⁺:YVO₄ waveguides deposited on amorphous Si0₂ by PLD and UVPLDMILEV, D. R; ATANASOV, P. A; DIKOVSKA, A. Og et al.Thin solid films. 2010, Vol 518, Num 16, pp 4726-4729, issn 0040-6090, 4 p.Conference Paper

Microstructure and magnetic properties of BaTiO₃-(Ni,Zn)Fe₂O₄ multiferroicsKOBLISCHKA, M. R; KOBLISCHKA-VENEVA, A; WICK, M et al.Thin solid films. 2010, Vol 518, Num 16, pp 4730-4733, issn 0040-6090, 4 p.Conference Paper